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X-Ray inspection
Systems for electronics, quality
control, forensics and failure analysis |
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ViewX range of Products |
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ViewX "Economy" |
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The VIEW-X is a high resolution x-ray system designed to address the
inspection and analysis needs of electronics ( BGA, CSP, flip Chip), semiconductors, and multi-layer
board registration, forensics, quality control and failure identification. Scienscope has created the VIEW-X for process
development, process monitoring and ongoing support of the rework and
repair function.
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The VIEW-X is a "batch" or manual type of x-ray system, it includes a
Windows based workstation (VIEW X-1000) with multiple image processing
functions for real time measurement and data collection. VIEW-X
combines ease of use, excellent image quality and low price in this
use-every-day system.
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ViewX-2000 "Luxury" |
● Up to 100 kV, 5 micron ( typical ) focal spot x-ray tube producing
125X geometric magnification, plus optical zoom for an additional 600X
magnification.
● Field of view
from1.5mm to 50mm (typical) (.05" to 2")
● Laser pointer for visual correlation.
● Z axis control of x-ray source (FOV and magnification control).
● Z axis movement of x-ray detector (FOV and magnification control).
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